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Machines

  • SapphiroScan™
  • SapphiroScope™
  • CarrotScan™

Software Suite 4

  • Yield
    • Introduction
    • Installing Yield
    • Using Yield
    • Scenarios
    • Options for SapphiroScope™ / SapphiroScan™ users
  • SVCI Viewer

Others

  • Machine File Structure (version of 06.01.2021)
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  • Yield

Yield¶

  • Introduction
    • What is it for?
    • Free and Pro Versions
    • Key Features
  • Installing Yield
    • System Requirements
    • Download Yield
    • How to install
  • Using Yield
    • Startup
    • Basics
    • Advanced
    • One-page Command Cheatsheet - Print It
  • Scenarios
    • Comparing Quality of Two Crystals
    • Finding Defect Threshold for Your Production Process
    • Optimisation of Wafering Yield
    • Unveiling Long-Time Trends in Production Quality
  • Options for SapphiroScope™ / SapphiroScan™ users
    • Tracking 3D defect to 2D tomography layer(s)
    • Re-computing a 3D Model
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