Yield

• Introduction
  • About the Software and Its Primary Functions
  • Key Features
  • Who Is It For?
  • Video overview:
• Chapter 1: Getting Started with Yield
  • System Requirements
  • Download Yield
  • Navigating the Main Screen
  • Top Menu Overview
  • Toolbar Overview
  • More About Appearance Settings
  • More about G-code
  • More About Generate Report
  • Views
• Chapter 2: Using the Crystal Tab
  • Crystal Information
  • Auxiliary Elements
  • Scan Settings & Process Settings
• Chapter 3: Using the References Tab
  • Reference Elements
  • Managing Reference Elements
  • Flag Checkpoint Feature
  • Action Buttons
• Chapter 4: Defects Tab
  • Managing Defects
  • Defect Parameters
  • Action Buttons
• Chapter 5: Coring Tab
  • Coring Modes
  • Core Parameters
  • Core Management Section
  • Core Visibility and Selection
  • Action Buttons
• Chapter 6: Wafering and Yield Optimization
  • Wafering Tab
  • Smart Wafering
• Scenarios
  • User Case 1: Comparing Quality of Two Crystals
  • User Case 2: From Crystal Scan to CNC Coring
  • User Case 3: Optimization of Wafering Yield for SiC Puck
  • User Case 4: Working in Expo Mode
• Glossary and Printables
  • Technical Terms Glossary
  • Shortcuts Master List