Yield-Pro Software

• Introduction
  • About Software
  • Key Features
  • Who Is It For?
  • Overview
• Chapter 1: Getting Started with Yield-Pro
  • System Requirements
  • Download Yield-Pro
  • Navigating the Main Screen
  • Top Menu Overview
  • Toolbar Overview
  • Appearance Settings
  • Views
  • Video: Interface, Shortcuts, Transparency & Texture
• Chapter 2: Loading data from SAM scanners
• Chapter 3: Crystal Tab
  • Crystal Information
  • Auxiliary Elements
  • Shape Visualization
  • Scan Settings
  • Process Settings
• Chapter 4: References Tab
  • Reference Elements
  • Managing Reference Elements
  • Action Buttons
• Chapter 5: Defects Tab
  • Managing Defects
  • Defect Types
  • Defect Parameters
  • Action Buttons
• Chapter 6: Coring Tab
  • Core Management Section
  • How to Create a Core
  • Core Parameters
  • Action Buttons
• Chapter 7: Wafering Tab
  • Wafering Configuration
  • How to compute Wafers?
  • Statistics Section
  • Wafer Details Section
  • Action Buttons
• Chapter 8: Smart Wafering
  • What is Smart Wafering?
  • Configure Smart Wafering Settings
  • Graph
• Chapter 9: Plots
  • Generate Plots
  • Grade Plots
  • Plots Key
• Chapter 10: Generate Report
  • How to Generate Report ?
  • Structure of the Wafer Report
  • Example
• Chapter 11: Create G-code for CNC Coring
  • Generating G-code in Yield-Pro
  • G-code structure
• How-To Scenarios
  • Comparing Quality of Two Crystals
  • From Crystal Scan to CNC Coring
  • Optimization of Wafering Yield for SiC Puck
  • Working in Expo Mode
• Glossary and Printables
  • Technical Terms Glossary
  • Shortcuts Master List