Modules Tabs

Modules tabs can be shown/hidden through menu and pined/unpined either on west or est side of the main window.

Demo version of Yield comes with three default modules.


Crystal Module

Crystal module is divided in three sections:

Crystal information

  • ID: unique identifier of the 3D model

  • Diameter: of the piece if it can be assimilated to cylinder

  • Height: of the piece

  • Material: of the piece

  • Comment: any comment

  • etc.

Auxiliary elements

Visibility and color of the auxiliary element in all Views can be set here

Scan settings information

Any scan settings metadata adding some physical context to numerical data


Auxiliary elements id usually use a standard over two digit.


Scan settings are disabled with demo models.


Defects Module

Defect module is composed of a table and action button. The table lists the individual defects displaying key, label, color and any predefined metrics considered as an integrated value of all smaller items.

Visibility and color of the defect elements in all Views can be set here.


Defects acts as clusters and are composed of at least one smaller items (i.e. points, meshes, etc). Individual defects are usually either spots (defined by morphology) or group of similar items (i.e group by intensities)


Mapping Module

The purpose of this module is to map items into the 3D crystal shape optimizing the output yield. Actually the first available mapping algorithm is dedicated to wafering: cutting wafers (~1-2 mm) out off grown-cylinder.

Mapping module is composed of two sections and some action buttons:

Mapping parameters

  • Mode: only wafer available. Assume wafering is perfectly vertical (aligned to z axis) and centered on (cx, cy)

  • Origin: z-level of the first wafer

  • Thickness: of desired wafers

  • Gap: between wafers induced by cutting wire

  • Center X (CX): center x-coordinate for wafering (usually 0)

  • Center Y (CY): center y-coordinate for wafering (usually 0)

Yield computation and results

Once parameter set, computation can be done pressing “Compute Yield”. It will take several second (see below note). Once computation ends, results are displayed below. First a readonly text area with statistics that can be copy paste for records and then the individual found items with default coloration such that:

  • Green for good material

  • Red for bad material

  • Gray for misfit material (meaning the item is overflowing the shape)

Visibility and color of the elements in Mapping view can be set here.


Advanced mapping algorithm (coming soon) are definitely more time consuming because mainly based on solving the backpack problem which is NP-hard.